Wafer AOI

  • Silicon carbide substrate appearance defect detection intelligent equipment
  • Appearance defect detection of non-patterned substrates intelligent equipment
  • Silicon carbide wafer critical dimension measurement intelligent equipment


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AOI Series-IC Packaging AOI Complete Solution

De-Bonding AOI

Breathtaking colors of our planet
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BGA Substrate Inspection

Portraits of people from around the globe
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Ball Mounter / Bumping AOI

Stark beauty of desolate dunes
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Under Fill / Dispenser AOI

Visual odyssey across continents
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AI Embedded System

Difficult Defect Detection

ADJ - Defect on BGA Substrate

ADC - Defect on PCB